Exhibitor Press Release
NEW PRODUCT: reflectCONTROL
MICRO-EPSILON MESSTECHNIK GmbH & Co. KG
Micro-Epsilon's reflectCONTROL sensors enable precise 3D surface inspection and defect detection on highly reflective and transparent surfaces. Using phase-measuring deflectometry, they generate a 3D point cloud from a projected stripe pattern, which reveals unevenness, scratches, and even the smallest deviations. The RCS130-160 3D HLP, optimized for production lines, features a GigE Vision interface for seamless integration into existing image processing systems. With a z-resolution in the nanometer range, a repeatability of < 1 µm, and up to 5 million 3D data points, the system is suitable for shape measurement on wafers and the inspection of painted automotive parts, among other things.
Contact:
MICRO-EPSILON MESSTECHNIK GmbH & Co. KG
Contact: Thomas Kitzlinger
Phone: +49 8542 / 168 - 221
Email: thomas.kitzlinger@micro-epsilon.de
